24th European Photovoltaic Solar Energy Conference, Hamburg, Germany (21-25 September 2009)
Highly predictive modelling of entire Si solar cells for industrial applications
Altermatt P.P., Steingrube S., Yang Y., Sprodowski C., Dezhdar T., Koc S., Veith B., Herrman S., Bock R., Bothe K., Schmidt J., Brendel R.
Imaging and analysis of pre-breakdown sites in multicrystalline silicon solar cells
Bothe K., Hinken D., Ramspeck K., Herlufsen S., Schmidt J., Brendel R., Bauer J., Wagner J.-M., Zakharov N., and Breitenstein O.
Formation of mesoporous germanium by electrochemical etching for lift-off processes
Garralaga Rojas E., Terheiden B., Hensen J., Köstler W., Zimmermann W., Strobl G., Plagwitz H., and Brendel R.
Camera-based photoluminescence lifetime imaging of crystalline silicon wafers
Herlufsen S., Schmidt J., Hinken D., Bothe K., and Brendel R.
Determination of the emitter saturation current density of silicon solar cells using photoluminescence and quantum efficiency analysis
Hinken D., Bothe K., Ramspeck K., Herlufsen S., and Brendel R.
Quantitative analysis of PV modules by electroluminescence images for quality control
Köntges M., Siebert M., Hinken D., Eitner U., Bothe K., and Potthof T.
Low-temperature gettering of iron in mono- and multicrystalline silicon
Krain R., Herlufsen S., and Schmidt J.
Boron-oxygen defects in compensated p-type Czochralski silicon
Macdonald D., Liu A., Rougieux F., Cuevas A., Lim B., Schmidt J., Di Sabatino M., and Geerligs L.J.
The buried emitter solar cell concept: interdigitated back-junction structure with virtually 100% emitter coverage of the cell area
Mertens V., Bordihn S., Larionova Y., Harder N.-P., and Brendel R.
Dynamic ILM – an approach to infrared-camera-based dynamical lifetime imaging
Ramspeck K., Bothe K., Schmidt J., and Brendel R.
VIRE effect: via-resistance-induced recombination enhancement – The origin of reduced fill factors of emitter wrap through solar cells
Ulzhöfer C., Hermann S., Harder N.-P., Altermatt P.P., Brendel R., Wade R., Engelhart P., Hlusiak M., Peters C., Rychtarik D., and Müller J. W.


